The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2017
Filed:
Sep. 10, 2015
Tomey Corporation, Nagoya-shi, JP;
Masahiro Yamanari, Nagoya, JP;
Tomey Corporation, Nagoya-shi, JP;
Abstract
Provided is an optical tomographic device for simultaneously acquiring a plurality of tomographic images at a same position in a subject without narrowing a depthwise measurement range. A measurement light generator generates at least two measurement lights with different optical path lengths, superimposes the at least two measurement lights, radiates the resultant light to a subject, and splits reflected light reflected from the subject into at least two reflected lights. A reference light generator generates at least two reference lights with different optical path lengths. An interfering light generator combines the at least two reflected lights and the at least two reference lights having corresponding different optical path lengths, to generate at least two interfering lights. An interfering light detector detects the at least two interfering lights independently by at least two interfering light detectors.