The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2017
Filed:
Jun. 25, 2010
Richard Lakhan, Pembroke, CA;
Brian Lepine, Petawawa, CA;
Joseph Renaud, Chalk River, CA;
Laurie Davey, Chalk River, CA;
Richard Lakhan, Pembroke, CA;
Brian Lepine, Petawawa, CA;
Joseph Renaud, Chalk River, CA;
Laurie Davey, Chalk River, CA;
Other;
Abstract
The present invention provides a probe apparatus and an associated method for measuring a magnetite deposit thickness, which apparatus and method is independent of the porosity and magnetic permeability of the magnetite deposit. The probe apparatus of this invention is an axial scanning and inside surface-following probe that can accurately and reliably measure the inside diameter of a tube. The probe apparatus of the present invention optionally comprises two modules: the first module is the surface-following module and the second module is a conventional eddy current probe.