The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2017

Filed:

May. 07, 2012
Applicants:

Andrew K. Boal, Albuquerque, NM (US);

Susan Rivera, Ellensburg, WA (US);

Justin Sanchez, Albuquerque, NM (US);

Wesley Bradford, Los Alamos, NM (US);

Inventors:

Andrew K. Boal, Albuquerque, NM (US);

Susan Rivera, Ellensburg, WA (US);

Justin Sanchez, Albuquerque, NM (US);

Wesley Bradford, Los Alamos, NM (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C02F 1/32 (2006.01); C02F 1/72 (2006.01); C02F 1/76 (2006.01); C02F 101/30 (2006.01);
U.S. Cl.
CPC ...
C02F 1/32 (2013.01); C02F 1/725 (2013.01); C02F 1/76 (2013.01); C02F 2101/30 (2013.01); C02F 2209/06 (2013.01); C02F 2303/04 (2013.01); Y02W 10/37 (2015.05);
Abstract

Method and apparatus for destroying organic contaminants in a fluid. At least one oxidant is added to a contaminated fluid, which is then irradiated with ultraviolet radiation. The oxidant is preferably chlorine-based and generated on-site. The intensity of the radiation is higher than typical AOP processes. Various process parameters, such as the pH and/or flow rate of the contaminated fluid, and/or the relative intensities of various UV wavelength sources, are varied in response to measuring quality indicators.


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