The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2017
Filed:
Dec. 22, 2011
Keisuke Yamakawa, Tokyo, JP;
Hironori Ueki, Yokohama, JP;
Yukiko Ueki, Yokohama, JP;
Keisuke Yamakawa, Tokyo, JP;
Hironori Ueki, Yokohama, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
The background projection data of a background region CT image in the X-ray emission path is calculated. Using measurement projection data and background projection data, the measurement projection data of local regions is calculated. Local region CT images are calculated on the basis of local measurement projection data, and the projection data of a local region CT image in the X-ray emission path is calculated. On the basis of local calculation projection data and local measurement projection data, local CT images are iteratively corrected. When creating background region CT images or calculating background projection data, the cause of calculation accuracy deterioration is eliminated by the use of processing such as smoothing, and without deterioration of CT value accuracy in regions other than the target region, a high-quality CT image is obtained.