The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2017

Filed:

Dec. 11, 2014
Applicant:

Verizon Patent and Licensing Inc., Arlington, VA (US);

Inventors:

Ye Ouyang, Piscataway, NJ (US);

Carol Becht, Boonton, NJ (US);

Assignee:

VERIZON PATENT AND LICENSING INC., Basking Ridge, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/16 (2015.01); H04B 17/318 (2015.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04B 17/16 (2015.01); H04B 17/318 (2015.01); H04W 24/10 (2013.01);
Abstract

A method includes receiving over-the-air (OTA) performance test data measured for a first set of pass computing devices and for a second set of fail computing devices, measuring a first set of training data for the first and second set of computing devices during a plurality of KPI tests, measuring a second set of training data for a particular computing device, determining which ones of the plurality of KPIs qualify as clustering features, and determining a first set of KPI centers, a second set of KPI centers, and a third set of KPI centers, determining a first and a second dissimilarity distance separating the first set and the second set of computing devices from the particular device, respectively. The method further includes determining whether the first dissimilarity distance is greater than second dissimilarity distance to qualify the particular computing device to pass the OTA test.


Find Patent Forward Citations

Loading…