The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2017

Filed:

Apr. 10, 2015
Applicant:

The United States of America As Represented BY the Secretary of the Navy, Washington, DC (US);

Inventors:

Patrick L. Cole, Bedford, IN (US);

Adam R. Duncan, Bloomington, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 17/14 (2006.01); H01L 27/06 (2006.01); H01L 29/78 (2006.01); H01L 29/10 (2006.01); H01L 21/8234 (2006.01); H03G 3/30 (2006.01); H01L 31/08 (2006.01); H03K 17/567 (2006.01); G01R 35/00 (2006.01); H01L 27/098 (2006.01); G01T 1/02 (2006.01); H01L 27/085 (2006.01); H01L 29/423 (2006.01); H01L 29/66 (2006.01); H03G 1/00 (2006.01); H01L 29/808 (2006.01);
U.S. Cl.
CPC ...
H03K 17/14 (2013.01); G01R 35/005 (2013.01); G01T 1/026 (2013.01); H01L 21/823412 (2013.01); H01L 27/0617 (2013.01); H01L 27/085 (2013.01); H01L 27/098 (2013.01); H01L 29/1045 (2013.01); H01L 29/1058 (2013.01); H01L 29/42368 (2013.01); H01L 29/66484 (2013.01); H01L 29/78 (2013.01); H01L 29/7832 (2013.01); H01L 31/08 (2013.01); H03G 1/007 (2013.01); H03G 3/3036 (2013.01); H03K 17/567 (2013.01); H01L 29/808 (2013.01);
Abstract

Systems and methods for controlling current or mitigating electromagnetic or radiation interference effects using structures configured to cooperatively control a common semi-conductive channel region (SCR). One embodiment includes providing a metal oxide semiconductor field effect transistor (MOSFET) section formed with an exemplary SCR and two junction field effect transistor (JFET) gates on opposing sides of the MOSFET's SCR such that operation of the JFET modulates or controls current through the MOSFET's. With two JFET gate terminals to modulate various embodiments' signal(s), an improved mixer, demodulator, and gain control element in, e.g., analog circuits can be realized. Additionally, a direct current (DC)-biased terminal of one embodiment decreases cross-talk with other devices. A lens structure can also be incorporated into MOSFET structures to further adjust operation of the MOSFET. An embodiment can also include a current leakage mitigation structure configured to reduce or eliminate current leakage between MOSFET and JFET structures.


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