The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Oct. 14, 2014
Samsung Electronics Co., Ltd, Suwon-si, Gyeonggi-do, KR;
Cheil Industries Inc., Gumi-si, Gyeongsangbuk-do, KR;
Samsung Corning Precision Materials Co., Ltd., Gumi-si, Gyeongsangbuk-do, KR;
Hyunmin Kim, Uiwang-si, KR;
Youmin Shin, Gyeongsangbuk-do, KR;
Hongshik Shim, Seoul, KR;
Young Oh, Uiwang-si, KR;
Chulho Jeong, Hwaseong-si, KR;
Eunyoung Cho, Gyeongsangbuk-do, KR;
SAMSUNG ELECTRONICS CO., LTD, Gyeonggi-Do, KR;
CORNING PRECISION MATERIALS CO., LTD., Chungcheongnam-Do, KR;
CHEIL INDUSTRIES INC., Gyeongsangbuk-Do, KR;
Abstract
A method of evaluating an image blur of an optical film includes displaying a test pattern by driving an organic light-emitting display apparatus including the optical film, obtaining an image by capturing the test pattern using a digital camera, obtaining a spatial luminance distribution from the image, transforming the spatial luminance distribution into a sensation curve, and estimating a blur width from the sensation curve, where the blur width is a distance between peaks having negative minimum values, from among a plurality of peaks of the sensation curve.