The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2017

Filed:

Jan. 22, 2016
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Melissa A. Smith, Somerville, MA (US);

Sunit S. Mahajan, Halfmoon, NY (US);

Herbert L. Ho, New Windsor, NY (US);

Assignee:

GLOBALFOUNDRIES INC., Grand Cayman, KY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/108 (2006.01);
U.S. Cl.
CPC ...
H01L 27/1087 (2013.01); H01L 27/10826 (2013.01); H01L 27/10832 (2013.01); H01L 27/10879 (2013.01);
Abstract

Methods of forming polysilicon-filled deep trenches for an eDRAM are provided. The method may include forming a plurality of polysilicon-filled deep trenches in a substrate. An epitaxy-retarding dopant is introduced to an upper portion of the trenches. A plurality of fins are then formed over the substrate, with each polysilicon-filled deep trench including a corresponding fin extending thereover. A silicon layer is epitaxially grown over at least the polysilicon-filled deep trench. The dopant in the polysilicon-filled deep trenches acts to control the epitaxial growth of the silicon layer, diminishing or preventing shorts to adjacent fins and/or deep trenches at advanced technology nodes.


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