The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2017

Filed:

Mar. 01, 2016
Applicant:

Mstar Semiconductor, Inc., Hsinchu Hsien, TW;

Inventors:

Chung-Ching Chen, Zhubei, TW;

Chen-Nan Lin, Zhubei, TW;

Yi-Hao Lo, Zhubei, TW;

Assignee:

MStar Semiconductor, Inc., Hsinchu Hsien, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01); G11C 29/16 (2006.01); G11C 29/52 (2006.01); G11C 29/02 (2006.01); G06F 11/20 (2006.01); G06F 11/27 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 29/16 (2013.01); G11C 29/025 (2013.01); G11C 29/52 (2013.01); G06F 11/2094 (2013.01); G06F 11/27 (2013.01); G11C 2029/0401 (2013.01);
Abstract

A memory self-testing device for testing a plurality of memory control units includes: a test control unit, coupled to the memory control units, generating a plurality of access request signals and a plurality of sets of data; a channel control unit, coupled to the test control unit and the memory control units, determining a leading feedback signal among a plurality of feedback signals; and a data control unit, coupled to the test control unit and the memory control units, storing the sets of data, and transmitting the sets of data to the memory control units according to a plurality of read/write signals. The feedback signals and the read/write signals are generated by the memory control units in response to the access request signals. The test control units generate the sets of data according to the leading feedback signal.


Find Patent Forward Citations

Loading…