The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Jun. 27, 2016
Applicant:
SK Hynix Inc., Icheon-si, Gyeonggi-do, KR;
Inventors:
Young Hyun Baek, Icheon-si, KR;
Bo Yeun Kim, Icheon-si, KR;
Sang Hee Kim, Incheon, KR;
Ji Eun Jang, Icheon-si, KR;
Assignee:
SK HYNIX INC., Icheon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 5/14 (2006.01); G11C 29/02 (2006.01); G11C 7/10 (2006.01); G11C 7/12 (2006.01); G11C 17/16 (2006.01); G11C 17/18 (2006.01); G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
G11C 29/027 (2013.01); G11C 5/148 (2013.01); G11C 7/10 (2013.01); G11C 7/12 (2013.01); G11C 17/16 (2013.01); G11C 17/18 (2013.01); G11C 29/78 (2013.01);
Abstract
A semiconductor system and semiconductor device may be provided. The semiconductor system may include a first semiconductor device configured to generate a test mode signal and configured to receive output data. The semiconductor system may include a second semiconductor device configured to enter a test mode, based on the test mode signal, and block the output data of data that is stored in redundancy memory cells connected to unrepaired redundancy word lines which are not used among redundancy word lines provided for replacing failed word lines.