The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Dec. 16, 2014
Applicant:
SK Hynix Inc., Gyeonggi-do, KR;
Inventor:
Sang-Hee Kim, Gyeonggi-do, KR;
Assignee:
SK Hynix Inc., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/18 (2006.01); G11C 17/16 (2006.01); G11C 29/24 (2006.01); G11C 29/44 (2006.01); G11C 29/20 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 29/00 (2013.01); G11C 17/16 (2013.01); G11C 29/18 (2013.01); G11C 29/24 (2013.01); G11C 29/44 (2013.01); G11C 29/78 (2013.01); G11C 29/20 (2013.01); G11C 2029/1202 (2013.01); G11C 2029/4402 (2013.01);
Abstract
A semiconductor memory device includes a memory cell array including a plurality of word lines; a repair fuse section programmed with one or more repair-target addresses and fuse enable information; an address generation section suitable for generating test addresses during a test operation, corresponding to the word lines based on the repair-target addresses and the fuse enable information; and a word line control section suitable for selectively activating the word lines based on the test addresses.