The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2017

Filed:

Aug. 14, 2015
Applicant:

Sharp Laboratories of America, Inc., Camas, WA (US);

Inventors:

Anustup Kumar Choudhury, Vancouver, WA (US);

Xu Chen, Vancouver, WA (US);

Petrus J. L. van Beek, Camas, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01); G06T 3/40 (2006.01); G06K 9/46 (2006.01); G06K 9/34 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 3/4053 (2013.01); G06K 9/342 (2013.01); G06K 9/46 (2013.01); G06T 5/00 (2013.01); G06T 2207/10016 (2013.01);
Abstract

A method for image enhancement may include selecting a plurality of patches of an image and determining at least one dimensionally reduced feature for each of the plurality of patches. The system may further determine a generally closest cluster from a set of clusters for each of the dimensionally reduced features and select a corresponding set of regression coefficients for each of the set of generally closest cluster. The system may also apply the selected set of regression coefficients to a corresponding patch to enhance the image.


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