The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Feb. 27, 2015
International Business Machines Corporation, Armonk, NY (US);
Yu Deng, Yorktown Heights, NY (US);
Rafah A. Hosn, New York, NY (US);
Ruchi Mahindru, Elmsford, NY (US);
Harigovind V. Ramasamy, Ossining, NY (US);
Soumitra Sarkar, Cary, NC (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Techniques for model-based analysis of a data center. A method includes creating a metamodel based on domain knowledge to represent a type of object and/or relationship of a data center, using static and dynamic configuration and data analysis techniques to discover topology of elements of the data center and represent the topology as a model that is an instance of the metamodel, extending the metamodel, using the model to perform analysis of the data center in connection with a specified task, leveraging domain knowledge represented in nodes of the extended metamodel to guide the analysis in terms of determining guidelines to apply to each node and determining relationships to traverse to continue the analysis, extending the domain knowledge by updating the extended metamodel upon discovery of additional knowledge for use in improving analysis tasks, and extending the model on-demand using dynamic analysis techniques upon detection of multiple analysis failures.