The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2017

Filed:

Dec. 18, 2008
Applicants:

Uwe Beck, Falkensee, DE;

Andreas Hertwig, Berlin, DE;

Dirk Hönig, Gottingen, DE;

Ralph Domnick, Buckenhof, DE;

Inventors:

Uwe Beck, Falkensee, DE;

Andreas Hertwig, Berlin, DE;

Dirk Hönig, Gottingen, DE;

Ralph Domnick, Buckenhof, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06K 19/14 (2006.01); G07D 7/00 (2016.01); G07D 7/12 (2016.01);
U.S. Cl.
CPC ...
G06K 19/14 (2013.01); G07D 7/0046 (2013.01); G07D 7/121 (2013.01); B42D 2035/00 (2013.01); B42D 2035/24 (2013.01);
Abstract

The present invention relates to a method and a corresponding apparatus for identifying a product () or information relating to the product (). In the method, a concealed code on the product () is identified, wherein the code is given by a set of ellipsometric parameters, and the method comprises the following steps of: measuring ellipsometric variables for at least one defined point () on a surface () of the product (), comparing the measured ellipsometric variables with at least one reference code, and determining a match between the measured ellipsometric variables and the reference code or one of the reference codes or determining a mismatch with each reference code.


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