The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Aug. 02, 2012
Masahiro Ikegami, Takaishi, JP;
Masahiro Ikegami, Takaishi, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
Specific-site extraction unitextracts specific sites from microscopy images that are obtained by staining or fluorescence labeling of specific sites in a specimen. Based on the similarity between MS imaging data and the spatial distribution of the specific sites, cluster analysis unitand division count determination processing unitevaluate the similarity with the spatial distribution of all pixels that belong to one cluster when each of the pixels are categorized into a plurality of clusters. Since the specific sites are sites that include the same characteristic substance, clustering is judged to be appropriate if the similarity in spatial distribution is high. Hence, based on the correlation between spatial distributions, an appropriate division count for the cluster analysis is determined, and the result of the cluster analysis using the division count is output on a display unit