The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2017

Filed:

Oct. 29, 2013
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventor:

Kentaro Kakui, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/34 (2006.01); G06N 7/00 (2006.01); G06F 11/32 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0751 (2013.01); G06F 11/008 (2013.01); G06F 11/0709 (2013.01); G06F 11/3419 (2013.01); G06F 11/3452 (2013.01); G06N 7/005 (2013.01); G06F 11/323 (2013.01);
Abstract

Provided is a method of detecting a warning sign indicating the occurrence of a system failure targeting a plurality of varied information processing systems. A system for monitoring a plurality of monitored systems receives measured values regarding a plurality of indexes, designates, from a plurality of prediction models, a prediction model for predicting a future measured value from the measured value that was received regarding a reference index, predicts a predicted value of the reference index based on the designated prediction model, generates or updates a Bayesian network targeting the reference index and a target index, and calculates a probability that a measured value of the target index will become a predetermined value or fall within a predetermined value range.


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