The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2017

Filed:

Feb. 19, 2016
Applicant:

Rave Llc, Delray Beach, FL (US);

Inventors:

Jeffrey E. LeClaire, Boca Raton, FL (US);

Kenneth G. Roessler, Boca Raton, FL (US);

David Brinkley, Baltimore, MD (US);

Assignee:

RAVE LLC, Delray Beach, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/82 (2012.01); G03F 1/72 (2012.01); B08B 7/00 (2006.01);
U.S. Cl.
CPC ...
G03F 1/82 (2013.01); B08B 7/0042 (2013.01); G03F 1/72 (2013.01); Y10S 134/902 (2013.01);
Abstract

A photomask includes at least one feature disposed thereon. The at least one feature has an associated design location, where a distance between a location of the at least one feature and the associated design location defines a positional error of the at least one feature. A method for improving a performance characteristic of the photomask includes directing electromagnetic radiation toward the photomask, the electromagnetic radiation having a wavelength that substantially coincides with a high absorption coefficient of the photomask; generating a thermal energy increase in the photomask through incidence of the electromagnetic radiation thereon; and decreasing the positional error as a result of the generating the thermal energy increase in the photomask.


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