The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Sep. 06, 2007
Frank Sieckmann, Bochum, DE;
Urban Liebel, Dielheim-Horrenberg, DE;
Frank Sieckmann, Bochum, DE;
Urban Liebel, Dielheim-Horrenberg, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
EMBL EUROPEAN MOLECULAR BIOLOGY LABORATORY, Heidelberg, DE;
Abstract
A method for scanning a sample using an electrically or electronically controllable microscope, includes scanning the sample so as to generate a plurality of images of the sample, each of the plurality of images corresponding to at least one of a different region of the sample and a different time. The microscope is controlled via a control computer during the scanning. The plurality of images are analyzed using at least one second computer connected via a network. The plurality of images are classified and/or the scanning is influenced based on the analyzing.