The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Apr. 09, 2013
Mitsubishi Electric Corporation, Chiyoda-ku, JP;
Tetsushi Azuma, Chiyoda-ku, JP;
Masateru Hayashi, Chiyoda-ku, JP;
Hiroshi Nishizawa, Chiyoda-ku, JP;
Hajime Nakajima, Chiyoda-ku, JP;
Kenji Inomata, Chiyoda-ku, JP;
Masakazu Nakanishi, Chiyoda-ku, JP;
Toshihide Aiba, Chiyoda-ku, JP;
Mitsubishi Electric Corporation, Chiyoda-ku, JP;
Abstract
A radioactivity analyzing apparatus for analyzing a radionuclide contained in a sample material. The apparatus includes a radiation detector that detects a radiation to be detected emitted from the sample material and a radiation analyzer configured to analyze the radiation based on an output from the radiation detector. The radiation analyzer includes a pulse-height analyzer configured to extract a pulse-height distribution from a pulse signal being output from the radiation detector and depending on the radiation, an inverse-problem operator configured to perform an inverse-problem solution of the pulse-height distribution to extract an energy spectrum of the radiation, and a deterioration detector configured to determine a deterioration state of the radiation detector based on the extracted energy spectrum.