The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2017

Filed:

Jan. 21, 2014
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Seo Hyun Jeon, Yongin, KR;

Min Su Jang, Daejeon, KR;

Dae Ha Lee, Daejeon, KR;

Chang Eun Lee, Daejeon, KR;

Hyun Ja Im, Daejeon, KR;

Young Jo Cho, Seongnam, KR;

Jae Hong Kim, Daejeon, KR;

Jong Hyun Park, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/74 (2006.01);
U.S. Cl.
CPC ...
G01S 17/74 (2013.01);
Abstract

Disclosed are an apparatus for measuring position of other apparatus and a method for the same. The apparatus may comprise at least one light emitting part transmitting a photo signal, at least one light receiving part receiving a photo signal transmitted from other apparatus, and a signal processing part controlling the at least one light emitting part to transmit the photo signal including identification information of itself, acquiring identification information of the other apparatus based on the photo signal received from the other apparatus, and acquiring a positional information of the other apparatus based on the acquired identification information of the other apparatus. Thus, the apparatus located in an arbitrary space may accurately acquire relative positional information of counterpart apparatuses.


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