The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Mar. 10, 2011
Applicants:
Stefanie Remmele, Hamburg, DE;
Wei Liu, Rockville, MD (US);
Tobias Ratko Voigt, London, GB;
Christian Stehning, Hamburg, DE;
Inventors:
Stefanie Remmele, Hamburg, DE;
Wei Liu, Rockville, MD (US);
Tobias Ratko Voigt, London, GB;
Christian Stehning, Hamburg, DE;
Assignee:
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/50 (2006.01); G01R 33/56 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
G01R 33/50 (2013.01); G01R 33/5601 (2013.01); G01R 33/5613 (2013.01); G01R 33/5616 (2013.01);
Abstract
The invention relates to a magnetic resonance imaging method for simultaneous and dynamic determination of a longitudinal relaxation time Tand a transversal relaxation time Tof the nuclear spin system of an object, in the context of DCE or DSE MRI. In this respect, the invention makes use of a steady-state gradient echo pulse sequence comprising an EPI readout module.