The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Jan. 14, 2014
Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Don A. Harris, Columbia, MD (US);
Michael J. Bowers, II, Sykesville, MD (US);
Roland A. Gilbert, Milford, NH (US);
Tadd C. Kippeny, Mount Airy, MD (US);
BAE Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Abstract
A system and method for detecting at least one compound in a material under test (MUT) is presented. The system includes a Nuclear Quadrupole Resonance (NQR) frequency generator that generates an NQR frequency (f) and propagates the ffrequency toward the MUT. A microwave frequency generator generates a microwave frequency (f) and propagates the ffrequency toward the MUT. A RF output probe detects radio frequency (RF) emissions returned from the MUT. A detector detects the at least one compound based, at least in part, on whether the RF emissions returned from the MUT include any frequencies corresponding to f+/−(n×f), where n is an integer of 2 or greater. In the preferred embodiment, n=2.