The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Jan. 05, 2016
International Business Machines Corporation, Armonk, NY (US);
Eugene R. Atwood, Housatonic, MA (US);
Mary P. Kusko, Hopewell Junction, NY (US);
Paul J. Logsdon, Poughkeepsie, NY (US);
Franco Motika, Hopewell Junction, NY (US);
Andrew A. Turner, Underhill, VT (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Technical solutions are described for optimizing a set of test configurations used for testing an electronic circuit that includes latches. An example method includes receiving a test configuration that includes settings that initiate a set of predetermined input values and corresponding expected output values. The method also includes evaluating the test configuration by executing the electronic circuit according to the test configuration and recording parametric data during the execution, where the parametric data is representative of switching activity of the latches in the electronic circuit. The evaluation includes analyzing the parametric data to identify presence of a predetermined pattern in the switching activity and selecting the test configuration based on the predetermined pattern being absent/present in the switching activity.