The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Feb. 24, 2014
Yamaichi Electronics Co., Ltd., Tokyo, JP;
Katsumi Suzuki, Tokyo, JP;
Yuji Nakamura, Tokyo, JP;
Takeyuki Suzuki, Tokyo, JP;
Yukio Ota, Kamiina-gun, JP;
YAMAICHI ELECTRONICS CO., LTD., Tokyo, JP;
Abstract
An inspection probeAi is formed by subjecting a thin sheet material made of a copper alloy to press working. The inspection probeAi includes: a device side plungerA having a contact point which selectively comes into contact with an electrode portion DVb of a semiconductor device DV; a board side plungerB having a contact point which selectively comes into contact with a contact pad of a printed wiring board; a spring portionD which biases the device side plungerA and the board side plungerB in a direction away from each other; and a cylindrical support stemC being disposed inside the spring portionD, making the spring portionD slidable thereon, and being configured to retain straight advancing property of the spring portionD.