The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Jan. 04, 2015
Applicants:
Uniflex Company, Ltd., Tokyo, JP;
Artel, Inc., Westbrook, ME (US);
Inventors:
Akira Hattori, Abiko, JP;
George Rodrigues, Westbrook, ME (US);
Axel Bjoern Carle, Portland, ME (US);
Assignees:
Artel, Inc., Westbrook, ME (US);
Uniflex Company, Ltd., Tokyo, JP;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 35/10 (2006.01); G01F 25/00 (2006.01); G01N 21/59 (2006.01); G01N 35/00 (2006.01); G01N 21/25 (2006.01); G01N 21/78 (2006.01);
U.S. Cl.
CPC ...
G01N 35/10 (2013.01); G01F 25/00 (2013.01); G01N 21/253 (2013.01); G01N 21/59 (2013.01); G01N 35/00623 (2013.01); G01N 35/1016 (2013.01); G01N 21/78 (2013.01);
Abstract
Method for validating the accuracy of automated analyzers by performing an improved dual dye ratio method procedure that uses at least first and second dye solutions in combination with gravimetric measurement of selected test solutions.