The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Oct. 23, 2014
Applicant:
Massachusetts Institute of Technology, Cambridge, MA (US);
Inventors:
Ian W. Hunter, Lincoln, MA (US);
Eli T. Paster, Cambridge, MA (US);
Assignee:
Massachusetts Institute of Technology, Cambridge, MA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/16 (2006.01); G01N 30/86 (2006.01); G01N 30/68 (2006.01); G01N 30/02 (2006.01); G01N 30/62 (2006.01);
U.S. Cl.
CPC ...
G01N 30/16 (2013.01); G01N 30/68 (2013.01); G01N 2030/025 (2013.01); G01N 2030/027 (2013.01); G01N 2030/167 (2013.01); G01N 2030/623 (2013.01);
Abstract
A method and system for continuous measurement chromatograph involves stochastically modulating a system variable. The sample can be introduced into a chromatography column. The sample introduction can be modulated stochastically. The sample output from the column can be detected and processed with the stochastic input to provide a sample analysis.
Hunter, Ian. (2017). Continuous measurement chromatography and method of continuous stochastic perturbation chromatography (U.S. Patent No. 9588087). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9588087
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile