The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Jul. 21, 2014
Mettler-toledo, Llc, Columbus, OH (US);
Eric V. Wechselberger, Powell, OH (US);
Jodelle D. Sparks, Delaware, OH (US);
Mettler-Toledo, LLC, Columbus, OH (US);
Abstract
Embodiments of the invention generally relate to weighing scale diagnostic methods employing a comparison of like component operating parameters. In certain embodiments, the difference between any two current operating parameter values may be compared against a maximum allowable difference, and/or the deviation of current operating parameters from a calculated measure of central tendency may be determined and compared against a maximum allowable deviation. Alternatively or additionally, a standard statistical test for outliers may be employed. An outlying difference or deviation may be indicative of a problem with the associated component. In other embodiments, the current operating parameters of like components may be compared against calibrated parameters and any deviation of the current parameter for a given component may be compared against the total deviation to determine the percentage of deviation attributable to that component.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile