The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2017

Filed:

Nov. 08, 2012
Applicant:

Harbin Institute of Technology, Harbin, Heilongjiang, CN;

Inventors:

Jiubin Tan, Heilongjiang, CN;

Pengcheng Hu, Heilongjiang, CN;

Xiaofei Diao, Heilongjiang, CN;

Assignee:

HARBIN INSTITUTE OF TECHNOLOGY, Nangang District, Harbin, Heilongjiang, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01J 9/04 (2006.01); G01B 11/14 (2006.01); G02B 27/28 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02007 (2013.01); G01B 9/02003 (2013.01); G01B 9/02027 (2013.01); G01B 9/02045 (2013.01); G01B 11/14 (2013.01); G01J 9/04 (2013.01); G01B 2290/70 (2013.01); G02B 27/283 (2013.01);
Abstract

A high speed high resolution heterodyne interferometric method and system are provided. The invention uses two spatially separated beams with slightly different frequencies and has two measurement signals with opposite Doppler shift. The switching circuit selects one of the two measurement signals for displacement measurement according to the direction and speed of the target movement. In this invention, the measurement is insensitive to the thermal variation; the periodic nonlinearity is essentially eliminated by using two spatially separated beams; the measurable target speed of the interferometer is no longer limited by the beat frequency of the laser source.


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