The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Nov. 04, 2008
Jeffrey T. Drewett, Kennedale, TX (US);
Paul T. Briney, Fort Worth, TX (US);
Grady L. White, Fort Worth, TX (US);
Gary L. Kelly, Fort Worth, TX (US);
Michael L. Hestness, Fort Worth, TX (US);
Todd H. Ashton, Fort Worth, TX (US);
Peter L. Morken, Rockwall, TX (US);
Jeffrey T. Drewett, Kennedale, TX (US);
Paul T. Briney, Fort Worth, TX (US);
Grady L. White, Fort Worth, TX (US);
Gary L. Kelly, Fort Worth, TX (US);
Michael L. Hestness, Fort Worth, TX (US);
Todd H. Ashton, Fort Worth, TX (US);
Peter L. Morken, Rockwall, TX (US);
LOCKHEED MARTIN CORPORATION, Bethesda, MD (US);
Abstract
A method is provided for the non-contact measurement of variations in thickness of composite materials and structures prepared from composite parts. Metrologic methods are employed to provide a 3D image of the structure or part. Variations that are greater than an acceptable amount can be corrected by adding a compensation layer to the surface of the structure or part.