The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Jul. 25, 2014
Novartis Ag, Basel, CH;
Alexander N. Artsyukhovich, Irvine, CA (US);
Novartis AG, Basel, CH;
Abstract
An ophthalmic surgical microscope can include a first light source configured to project a first light beam at an observer's eye. The microscope can include a first wavefront sensor. The first wavefront sensor can be configured to determine aberrations in the first reflection wavefront of a reflection of the first light beam. The microscope can include adaptive optical element(s). The adaptive optical element(s) can be controlled to modify the phase of incident light. The microscope can include a computing device in communication with the first wavefront sensor and the adaptive optical element(s). The computing device can be configured to generate the control signal to compensate for the aberrations and to provide the control signal to the adaptive optical element(s). A second light source and second wavefront sensor can be provided to compensate for aberrations of a subject's eye.