The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Jul. 04, 2013
Essilor International (Compagnie Generale D'optique), Charenton-le-Pont, FR;
Konogan Baranton, Charenton-le-Pont, FR;
Benjamin Rousseau, Charenton-le-Pont, FR;
Fabien Divo, Charenton-le-Pont, FR;
Guilhem Escalier, Charenton-le-Pont, FR;
ESSILOR INTERNATIONAL (COMPAGNIE GENERALE D'OPTIQUE), Charenton-le-Pont, FR;
Abstract
A device for measuring the objective ocular refraction of a patient for a plurality of visual ranges, which includes a variable proximity optical sight system capable of selectively generating a first target and a second target and an image-capturing device having an optical measurement axis intended for being aligned with a line of sight of the patient, the image-capturing device being capable of capturing a first ocular refraction image when the first target is activated and a second ocular refraction image when the second target is activated. The image-capturing device and the optical sight system are arranged such that the optical measurement axis and the optical sight axis are arranged such that the optical measurement axis and the optical sight axis are contained in a single plane and the optical measurement axis is tilted at an angle alpha between +5 degrees and +85 degrees relative to the horizontal.