The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2017
Filed:
Jan. 10, 2014
Klippel Gmbh, Dresden, DE;
Wolfgang Klippel, Dresden, DE;
Daniel Knobloch, Dresden, DE;
Klippel GmbH, Dresden, DE;
Abstract
The invention provides an arrangement and a method for measuring the direct sound wradiated by an acoustical source under test (e.g. loudspeakers) under the influence of acoustic ambient noise sources Qand reflections at acoustical boundaries (e.g. room walls). An acquisition device measures a state variable p(r) of the sound field at a plurality of measurement points rin a scanning range Gby a sensor and generates a scanned data set p. Based on this data set an analyzer determines the coefficients Cassociated with expansion functions which are solutions of the wave equation. An identifier uses the scanned data set pfor generating parameter information P for the analyzer which are the basis for separating the direct sound wfrom room reflections wand other waves wscattered at the surface of the source under test. An extrapolator predicts the state variable pof the direct sound wat any point outside the scanning range Gby using the coefficients Cof the wave expansion.