The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Mar. 31, 2014
Applicant:

Semiconductor Components Industries, Llc, Phoenix, AZ (US);

Inventors:

Jeffery Beck, Philomath, OR (US);

Charles McCord, Corvallis, OR (US);

Christopher Silsby, Albany, OR (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); H04N 17/02 (2006.01); G06T 7/00 (2006.01); H04N 17/04 (2006.01); H04N 1/00 (2006.01); H04N 5/367 (2011.01); H04N 5/369 (2011.01); H04N 5/374 (2011.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); G06T 7/0018 (2013.01); H04N 1/00021 (2013.01); H04N 5/367 (2013.01); H04N 5/3698 (2013.01); H04N 5/374 (2013.01); H04N 17/045 (2013.01);
Abstract

An imaging system may include an array of image pixels and verification circuitry. The verification circuitry may inject test voltages into the image pixel array during the photodiode reset operation. The test signals may then be read out using a correlated double sampling operation. Verification circuitry may compare the test signals to reference data to determine whether the imaging system is functioning properly (e.g., to determine whether the array of image pixels satisfies performance criteria). If the amount of mismatch between the test signals and the reference data exceed a predetermined threshold, the imaging system may be disabled and/or a warning signal may be presented to a user of the system.


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