The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Aug. 29, 2013
Applicant:

Rockwell Collins, Inc., Cedar Rapids, IA (US);

Inventors:

Donald J. Whalen, Cedar Rapids, IA (US);

Brad A. Walker, Mount Vernon, IA (US);

Scott E. Schultz, Cedar Rapids, IA (US);

Assignee:

Rockwell Collins, Inc., Cedar Rapids, IA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); H04N 13/00 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0018 (2013.01);
Abstract

Present novel and non-trivial system, device, and method for correcting misaligned images are disclosed. A system may be comprised of a source of first model data, a source of second model data, and an image generator ('IG'). The IG may be configured to perform a method comprised of receiving first model data representative of a first three-dimensional model; determining feature data of one or more first features located in an outside scene; receiving second model data representative of a second three-dimensional model in which one or more second features are located in the outside scene; determining differences data representative of feature differences between at least one first feature and at least one second feature; and applying the differences data to one or more pixel data sets, where such modification may be based upon a comparison between one or more first features and one or more correlating second features.


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