The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Nov. 10, 2014
Applicant:

Semiconductor Components Industries, Llc, Phoenix, AZ (US);

Inventor:

John Ladd, Santa Clara, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/3745 (2011.01); H04N 5/378 (2011.01); H04N 5/347 (2011.01); H04N 5/353 (2011.01);
U.S. Cl.
CPC ...
H04N 5/3745 (2013.01); H04N 5/347 (2013.01); H04N 5/3532 (2013.01); H04N 5/378 (2013.01);
Abstract

An image sensor configured to readout an arbitrary number of rows in parallel is described, comprising a rolling global shutter pixel array which can be operated as a true global shutter. Shielding structures may be formed in the pixel array to minimize signal coupling between adjacent pixels when multiple rows are simultaneously reset and read out. A plurality of column select lines may be formed in a given pixel pitch, and the image sensor may utilize read out components and circuitry associated with conventional readout circuits to be used in simultaneously reading out a two-dimensional region of the image sensor. The image sensor may be configured to use charge binning between rows that are reset and read out in parallel to improve power consumption. The image sensor may include redundant output stages with routing circuitry that improves image sensor yield by compensating for yield loss in the output stage.


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