The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Mar. 24, 2016
Applicant:

Solid, Inc., Seongnam-si, Gyeonggi-do, KR;

Inventors:

Hyoungho Kim, Seoul, KR;

Doyoon Kim, Bucheon-si, KR;

Yeongshin Yeo, Gwangmyeong-si, KR;

Assignee:

SOLID, INC., Seongnam-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04B 7/04 (2006.01); H04W 24/06 (2009.01); H04B 7/02 (2006.01); H04W 88/08 (2009.01);
U.S. Cl.
CPC ...
H04L 43/0864 (2013.01); H04B 7/024 (2013.01); H04B 7/04 (2013.01); H04W 24/06 (2013.01); H04W 88/085 (2013.01);
Abstract

A node unit of distributed antenna system, the node unit comprises a delay measuring part configured to transmit a first test signal for delay measurement to an upper adjacent node unit and detect the first test signal looped back via the upper adjacent node unit and measure a round trip delay between the node unit and the upper adjacent node unit, and a delay providing part disposed on a signal transmission path through which a second test signal for delay measurement, to be transmitted from a lower adjacent node unit, is to be looped back to the lower adjacent node unit, and configured to provide a delay corresponding to the round trip delay.


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