The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Mar. 13, 2013
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Takahiro Nobukiyo, Tokyo, JP;

Yasushi Maruta, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 5/00 (2006.01); H04L 1/00 (2006.01); H04L 1/20 (2006.01);
U.S. Cl.
CPC ...
H04L 5/0057 (2013.01); H04L 1/0003 (2013.01); H04L 1/0009 (2013.01); H04L 1/203 (2013.01); H04L 5/0073 (2013.01);
Abstract

The present invention addresses the problem of providing technology which increases the accuracy for estimating quality of a communication channel even in a case in which transmission time limit frames have been set between neighboring cells. The present application relates to quality estimation of a communication channel used by a base station for performing wireless communication with a terminal within a communication area, and is characterized in acquiring quality information for the communication channel between the base station and the terminal, acquiring reception error information related to reception errors for data communication using the communication channel, acquiring transmission time-limit frame information set by a neighboring base station of the base station, updating correction values in accordance with setting information for the transmission time-limit frame information and the reception error information, and estimating the quality of the communication channel using the correction values and the acquired quality information.


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