The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Oct. 19, 2015
Applicant:

Mediatek Inc., Hsin-Chu, TW;

Inventors:

Frank Op 't Eynde, Wilsele, BE;

Nathan Egan, Burlington, MA (US);

Khurram Muhammad, Fort Worth, TX (US);

Tien-Yu Lo, Hsinchu, TW;

Chi-Lun Lo, Taoyuan County, TW;

Michael A. Ashburn, Groton, MA (US);

Assignee:

MediaTek Inc., Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); H03M 1/12 (2006.01); H03M 3/00 (2006.01);
U.S. Cl.
CPC ...
H03M 1/109 (2013.01); H03M 1/1038 (2013.01); H03M 1/12 (2013.01); H03M 3/50 (2013.01);
Abstract

Systems and methods for measuring and compensating a DC-transfer characteristic of analog-to-digital converters are described. A test-signal generator comprising a sigma-delta modulator may provide calibration signals to an ADC. An output from the ADC may be filtered with a notch filter to suppress quantization noise at discrete frequencies introduced by the sigma-delta modulator. The resulting filtered signal may be compared against an input digital signal to the test-signal generator to determine a transfer characteristic of the ADC.


Find Patent Forward Citations

Loading…