The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Jun. 10, 2015
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Qi Ye, San Diego, CA (US);

Zhengyu Duan, San Diego, CA (US);

Steven James Dillen, San Diego, CA (US);

Animesh Datta, San Diego, CA (US);

Assignee:

QUALCOMM INCORPORATED, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 3/289 (2006.01); H03K 19/00 (2006.01); H03K 3/3562 (2006.01);
U.S. Cl.
CPC ...
H03K 19/0013 (2013.01); H03K 3/35625 (2013.01);
Abstract

A MOS device includes a first latch configured with one latch feedback F and configured to receive a latch input I and a latch clock C. The first latch is configured to output Q, where the output Q is a function of CF, IF, and I, and the latch feedback F is a function of the output Q. The first latch may include a first set of transistors stacked in series in which the first set of transistors includes at least five transistors. The MOS device may further include a second latch coupled to the first latch. The second latch may be configured as a latch in a scan mode and as a pulse latch in a functional mode. The first latch may operate as a master latch and the second latch may operate as a slave latch during the scan mode.


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