The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Nov. 04, 2014
Applicants:

Yonghwan Jeong, Hwaseong-si, KR;

Hoiju Chung, Yongin-si, KR;

Inventors:

Yonghwan Jeong, Hwaseong-si, KR;

Hoiju Chung, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/42 (2006.01); G06F 11/10 (2006.01); G06F 11/22 (2006.01); G11C 11/40 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 29/42 (2013.01); G06F 11/1008 (2013.01); G06F 11/1048 (2013.01); G06F 11/2215 (2013.01); G11C 11/40 (2013.01); G11C 2029/0411 (2013.01);
Abstract

A semiconductor memory device is provided which includes memory cells, a first error correction code (ECC) circuit configured to generate at least one selected parity bit corresponding to a selected data bit using an error correction code during a write operation and to correct an error of the selected data bit using the selected parity bit during a read operation, and a test circuit configured to selectively perform at least one of an error correction operation and a redundancy repair operation on at least one of the selected data bit and the selected parity bit based on test mode register set (TMRS) information.


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