The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2017
Filed:
Nov. 15, 2012
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Shuichi Kawana, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
A measurement EIC for quantitative ions and a measurement EIC for ions to be confirmed in the vicinity of the retention time of a target compound are displayed in an overlapping manner in a chromatogram display area. In addition, a standard center line corresponding to a standard value of the confirmation ion ratio, which expresses the ratio of the intensity of the confirmation ions to the intensity of the quantitative ions in the target compound and an upper limit line and a lower limit line demonstrating the permissible range of the intensity of the confirmation ions are displayed in an overlapping manner on the EIC. An analyst determines whether a peak used for identification originates from the target compound by determining whether the top of an EIC peak of the confirmation ions falls between the upper limit line and the lower limit line.