The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2017
Filed:
Feb. 27, 2015
Hexagon Metrology (Israel) Ltd., Ramat Hasharon, IL;
Tal Vagman, Tel Aviv, IL;
Jordi Edo Abella, Barcelona, ES;
HEXAGON METROLOGY (ISRAEL) LTD., Ramat Hasharon, IL;
Abstract
Some embodiments of the invention include a method for capturing and analyzing monitoring data of a measuring system. In some embodiments, the measuring system may include one or more sensors and being adapted for a measuring operation of a series of identical objects the measuring operation comprising a multitude of measuring sequences, each measuring sequence comprising the measuring of values of features of an object of the series, the method comprising a multitude of monitoring operations, wherein each monitoring operation comprises capturing monitoring data during a measuring sequence, the monitoring data of each measuring sequence including at least one image comprising the measuring system and/or a measurement environment, characterized by selecting a subset of measuring sequences from the multitude of measuring sequences; and visualizing an image sequence comprising the images of the monitoring data of the measuring sequences of the subset.