The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Jun. 29, 2015
Applicant:

Politechnika Poznanska, Poznan, PL;

Inventors:

Marek Domanski, Poznan, PL;

Tomasz Grajek, Poznan, PL;

Damian Karwowski, Poznan, PL;

Krzysztof Klimaszewski, Murowana Goslina, PL;

Olgierd Stankiewicz, Poznan, PL;

Jakub Stankowski, Poznan, PL;

Krzysztof Wegner, Murowana Goslina, PL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 5/00 (2006.01); G06T 15/00 (2011.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); G06T 7/0075 (2013.01); G06T 15/00 (2013.01); G06T 2207/10012 (2013.01);
Abstract

A method for depth-image-based rendering, the method comprising the steps of: obtaining a first reference view; obtaining a depth map for the first reference view; obtaining a second reference view; obtaining a depth map for the second reference view; the method further comprising the steps of extracting noise present in the first and the second reference views; denoising the first and the second reference views and, based on the denoised first and second reference views, rendering an output view using depth-image-based rendering; adding the extracted noise to the output view.


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