The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Jul. 29, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Lukasz Pintal, Wleń, PL;

Krzysztof Piotrowski, Wrocław, PL;

Michal Popek, Otmuchów, PL;

Wojciech Sura, Wrocław, PL;

Kamil Zukowski, Sokółka, PL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4671 (2013.01); G06T 7/0097 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/20221 (2013.01); G06T 2207/30041 (2013.01);
Abstract

A method and apparatus for determining the position of a feature of an object under test in a tomography image are disclosed. The method includes: determining characterizing points, in an additional image, of a feature of the object of interest; determining position data relating to the feature in the additional image based on the detected characterizing points; and identifying a feature of the object of interest in the tomography image. The determined position data in the additional image is used to guide the identification. A computer readable medium which may be non-transitory and upon execution by a processor configures a computer to perform the method is also disclosed.


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