The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Dec. 24, 2014
Applicant:

Altera Corporation, San Jose, CA (US);

Inventors:

Steven Teig, Menlo Park, CA (US);

Andrew Caldwell, Santa Clara, CA (US);

Assignee:

Altera Coroporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5081 (2013.01); G06F 17/505 (2013.01); G06F 17/5009 (2013.01);
Abstract

A method of optimizing timing performance of an IC design is provided. The IC design is expressed as a graph that includes several nodes that represent IC components. The method identifies a path in the graph that starts from a timed source node and ends at a timed target node. The path has several clocked elements and several computational elements. The method optimizes the timing performance of the IC design by skewing clock signals to a set of clocked elements without changing the position of any clocked element relative to the position of the computational elements in the path. The clock signal of at least one clocked element is skewed by more than a period of the clock signal. The method implements the IC design by using the optimized IC design.


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