The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2017
Filed:
Sep. 07, 2012
Jianbing Huang, Shoreview, MN (US);
Guy Roetcisoender, Mosier, OR (US);
Balaji Venkatasubramaniam, Maharashtra, IN;
Jeremy S. Bennett, Ames, IA (US);
Jianbing Huang, Shoreview, MN (US);
Guy Roetcisoender, Mosier, OR (US);
Balaji Venkatasubramaniam, Maharashtra, IN;
Jeremy S. Bennett, Ames, IA (US);
Siemens Product Lifecycle Management Software Inc., Plano, TX (US);
Abstract
Systems and methods for massive model visualization in product data management (PDM) systems. A method includes storing a hierarchical product data structure by a product data management (PDM) system, including a plurality of occurrence nodes and component nodes. The method includes receiving a query that references an occurrence node and at least one cell index value and determining a query result corresponding to the query. The query result identifies at least one occurrence node that corresponds to the cell index value. The method includes forming a query result chain corresponding to the query result, the query result chain filtered by a structural criterion, and applying a configuration rule to the filtered query result chain to identify child nodes of the filtered query result chain that conform to the configuration rule, and thereby producing a configured spatial retrieval result.