The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Nov. 20, 2013
Applicant:

Olympus Corporation, Shibuya-ku, Tokyo, JP;

Inventor:

Masayoshi Yokota, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G02B 23/24 (2006.01); G01B 11/25 (2006.01); A61B 1/00 (2006.01); A61B 1/06 (2006.01); A61B 5/107 (2006.01); A61B 1/045 (2006.01);
U.S. Cl.
CPC ...
G02B 23/2415 (2013.01); A61B 1/0005 (2013.01); A61B 1/00009 (2013.01); A61B 1/00066 (2013.01); A61B 1/00193 (2013.01); A61B 1/045 (2013.01); A61B 1/0684 (2013.01); A61B 5/1077 (2013.01); A61B 5/1079 (2013.01); G01B 11/25 (2013.01); H04N 13/0203 (2013.01); A61B 1/00052 (2013.01);
Abstract

Provided with an endoscope device configured to measure a specimen using a pattern projection image of the specimen on which a light and shade pattern of light is projected, includes: an imaging unit configured to acquire an image of the specimen; an illumination unit having a first light source configured to emit illumination light to illuminate an observation field of vision of the imaging unit; a pattern projection unit having a second light source configured to emit projection light to project the light and shade pattern on the specimen; a display unit configured to display the image acquired by the imaging unit; and a control unit configured to control the imaging unit, the illumination unit, the pattern projection unit, and the display unit.


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