The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Dec. 05, 2013
Applicant:

Landmark Graphics Corporation, Houston, TX (US);

Inventors:

Keshava P Rangarajan, Sugarland, TX (US);

Serkan Dursun, Missouri City, TX (US);

Amit Kumar Singh, Houston, TX (US);

Assignee:

LANDMARK GRAPHICS CORPORATION, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/60 (2006.01); G06G 7/48 (2006.01); G01V 99/00 (2009.01);
U.S. Cl.
CPC ...
G01V 99/005 (2013.01); G01V 2210/62 (2013.01);
Abstract

A system and method for determination of importance of attributes among a plurality of attribute importance models incorporating a segmented attribute kerneling (SAK) method of attribute importance determination. The method permits operation of multiple attribute importance algorithms simultaneously, finds the intersecting subset of important attributes across the multiple techniques, and then outputs a consolidated ranked set. In addition, the method identifies and presents a ranked subset of the attributes excluded from the union.


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