The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Apr. 23, 2012
Applicants:

Paolo Terenghi, Usmate, IT;

William H. Dragoset, Jr., Houston, TX (US);

Ian Moore, Mosman Park, AU;

Inventors:

Paolo Terenghi, Usmate, IT;

William H. Dragoset, Jr., Houston, TX (US);

Ian Moore, Mosman Park, AU;

Assignee:

WesternGeco L.L.C., Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/00 (2006.01); G01V 1/36 (2006.01);
U.S. Cl.
CPC ...
G01V 1/36 (2013.01); G01V 2210/56 (2013.01);
Abstract

A method and apparatus for predicting interbed multiples is described herein. Trace geometries may be generated for one or more desired shot-side traces, one or more desired receiver-side traces, and one or more desired interbed multiple generator traces, for a first target trace. A first set of reflections at the interbed multiple generator layer may be extracted from one or more recorded traces closest to the desired interbed multiple generator traces. A second set of reflections below the interbed multiple generator layer may be extracted from one or more recorded traces closest to the desired shot-side traces. A third set of reflections below the interbed multiple generator layer may be extracted from one or more recorded traces closest to the desired receiver-side traces. The interbed multiples for the first target trace may be estimated based on the first set, the second set, and the third set.


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