The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

May. 21, 2013
Applicant:

Sony Corporation, Tokyo, JP;

Inventor:

Shin Hotta, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/36 (2006.01); B60L 11/18 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3606 (2013.01); B60L 11/1861 (2013.01); G01R 31/3651 (2013.01); B60L 2240/545 (2013.01); B60L 2240/547 (2013.01); B60L 2240/549 (2013.01); B60L 2260/44 (2013.01); G01R 31/3624 (2013.01); G01R 31/3675 (2013.01); Y02T 10/7005 (2013.01); Y02T 10/705 (2013.01); Y02T 10/7011 (2013.01); Y02T 10/7016 (2013.01); Y02T 10/7044 (2013.01);
Abstract

A method of estimating a state of charge of a secondary cell includes: calculating a value of (∂E/∂T) in advance on the assumption that Eis an electromotive force of the secondary cell and T is a temperature of the secondary cell; and calculating the state of charge based on at least a value of (∂E/∂T) for which a value of the state of charge is set as a variable, a temperature measurement value of the secondary cell, and a current measurement value of the secondary cell.


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